DocumentCode :
3359386
Title :
Improved Estimates Of Fermi Screening Of Charged Impurities In Degenerate Semiconductors
Author :
Mendez, A.J.
Author_Institution :
University of Southern California
fYear :
1990
fDate :
4-9 Nov 1990
Firstpage :
640
Lastpage :
641
Keywords :
Dielectric constant; Dielectric measurements; Dielectric thin films; Frequency estimation; Optical films; Optical scattering; Particle scattering; Quantum mechanics; Semiconductor impurities; Semiconductor thin films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE
Print_ISBN :
0-87942-550-4
Type :
conf
DOI :
10.1109/LEOS.1990.690709
Filename :
690709
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3359386
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