• DocumentCode
    3359386
  • Title

    Improved Estimates Of Fermi Screening Of Charged Impurities In Degenerate Semiconductors

  • Author

    Mendez, A.J.

  • Author_Institution
    University of Southern California
  • fYear
    1990
  • fDate
    4-9 Nov 1990
  • Firstpage
    640
  • Lastpage
    641
  • Keywords
    Dielectric constant; Dielectric measurements; Dielectric thin films; Frequency estimation; Optical films; Optical scattering; Particle scattering; Quantum mechanics; Semiconductor impurities; Semiconductor thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE
  • Print_ISBN
    0-87942-550-4
  • Type

    conf

  • DOI
    10.1109/LEOS.1990.690709
  • Filename
    690709
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3359386