DocumentCode
3359628
Title
X-Press Compactor for 1000x Reduction of Test Data
Author
Rajski, J. ; Tyszer, J. ; Mrugalski, G. ; Cheng, W.-T. ; Mukherjee, N. ; Kassab, M.
Author_Institution
Mentor Graphics Corp., Wilsonville, OR
fYear
2006
fDate
Oct. 2006
Firstpage
1
Lastpage
10
Abstract
The paper presents a two-stage test response compactor with an overdrive section and scan chain selection logic. The proposed solution is capable of handling a wide range of X state profiles, offers compaction much higher than the ratio of scan chains to compactor outputs, and provides excellent diagnostic resolution
Keywords
boundary scan testing; data reduction; logic testing; X state profiles; X-press compactor; diagnostic resolution; scan chain selection logic; test data reduction; test response compactor; Automatic test pattern generation; Built-in self-test; Circuit testing; Compaction; Graphics; Logic testing; Maintenance; Observability; Silicon; State feedback;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2006. ITC '06. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
1-4244-0292-1
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2006.297643
Filename
4079321
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