Title :
DIBPro: Automatic Diagnostic Program Generation Tool
Author :
Kalyanaraman, Venkat ; Kim, Bruce C. ; Variyam, Pramod ; Cherubal, Sasikumar
Author_Institution :
Texas Instruments Inc., Dallas, TX
Abstract :
This paper describes the design and implementation of a tool for generating automatic diagnostic programs for mixed-signal device interface boards (DIB). The tool can be utilized on any ATE platform
Keywords :
automatic test equipment; automatic test pattern generation; automatic test software; program diagnostics; DIBPro; automatic diagnostic program generation; automatic test equipment; mixed-signal device interface boards; Automatic testing; Circuit faults; Circuit testing; Costs; Electronic equipment manufacture; Instruments; Pins; Production; Test equipment; Throughput;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297655
