ISI Injection Filter Designs Using PIN and Varactor Diodes for SerDes Testing on ATE

Author

Zhang, Fengming ; Necoechea, Warren

Author_Institution

LTX Corp., San Jose, CA

fYear

2006

fDate

Oct. 2006

Firstpage

1

Lastpage

7

Abstract

This paper presents two ISI injection filter designs using PIN diodes, varactor diodes, fixed inductors, and transmission line inductance for SerDes device testing. Simulation results show that the combination of the simple single stage filter and the complex 3-stage filter can emulate transmission lines up to 90 inch long from 1Gbps to 6.4Gbps. Eye diagram measurement results show that the simple filter can work as a fine tune ISI injection filter or a baseline with minimum ISI for higher bit rates, while the complex filter can close eye up to 28% UI at 1Gbps and up to 100% UI at a bit rate of 6.4Gbps

Keywords

automatic test equipment; digital signal processing chips; filters; integrated circuit testing; intersymbol interference; 1 to 6.4 Gbit/s; ATE; PIN diode; SerDes testing; automatic test equipment; eye diagram measurement; filter designs; intersymbol interference; transmission line inductance; varactor diodes; Bit rate; Diodes; Filters; Inductance; Inductors; Intersymbol interference; Signal analysis; Testing; Transmission line measurements; Varactors;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2006. ITC '06. IEEE International

Conference_Location

Santa Clara, CA

ISSN

1089-3539

Print_ISBN

1-4244-0292-1

Electronic_ISBN

1089-3539

Type

conf

DOI

10.1109/TEST.2006.297670

Filename

4079348