Title : 
ISI Injection Filter Designs Using PIN and Varactor Diodes for SerDes Testing on ATE
         
        
            Author : 
Zhang, Fengming ; Necoechea, Warren
         
        
            Author_Institution : 
LTX Corp., San Jose, CA
         
        
        
        
        
        
            Abstract : 
This paper presents two ISI injection filter designs using PIN diodes, varactor diodes, fixed inductors, and transmission line inductance for SerDes device testing. Simulation results show that the combination of the simple single stage filter and the complex 3-stage filter can emulate transmission lines up to 90 inch long from 1Gbps to 6.4Gbps. Eye diagram measurement results show that the simple filter can work as a fine tune ISI injection filter or a baseline with minimum ISI for higher bit rates, while the complex filter can close eye up to 28% UI at 1Gbps and up to 100% UI at a bit rate of 6.4Gbps
         
        
            Keywords : 
automatic test equipment; digital signal processing chips; filters; integrated circuit testing; intersymbol interference; 1 to 6.4 Gbit/s; ATE; PIN diode; SerDes testing; automatic test equipment; eye diagram measurement; filter designs; intersymbol interference; transmission line inductance; varactor diodes; Bit rate; Diodes; Filters; Inductance; Inductors; Intersymbol interference; Signal analysis; Testing; Transmission line measurements; Varactors;
         
        
        
        
            Conference_Titel : 
Test Conference, 2006. ITC '06. IEEE International
         
        
            Conference_Location : 
Santa Clara, CA
         
        
        
            Print_ISBN : 
1-4244-0292-1
         
        
            Electronic_ISBN : 
1089-3539
         
        
        
            DOI : 
10.1109/TEST.2006.297670