Embedded Memory Diagnosis: An Industrial Workflow

Author

Appello, Davide ; Tancorre, Vincenzo ; Bernardi, Paolo ; Grosso, Michelangelo ; Rebaudengo, Maurizio ; Reorda, Matteo Sonza

Author_Institution

STMicroelectronics, Agrate Brianza

fYear

2006

fDate

Oct. 2006

Firstpage

1

Lastpage

9

Abstract

Embedded memory modules are sensitive components that deeply influence production yield of integrated devices. For fast yield improvement, an efficient manufacturing test must supply advanced defect characterization that helps in discovering technology weaknesses and finding strategies for improvement. This paper presents an industrial workflow for embedded memory diagnosis. It is based on the integration of March-based diagnostic BIST hardware in an IEEE 1500-compliant environment, and on a novel diagnostic algorithm for determining the fault model associated to the retrieved syndromes. An experimental implementation showing the feasibility of the approach is presented

Keywords

built-in self test; fault simulation; integrated circuit testing; integrated circuit yield; production testing; semiconductor storage; IEEE 1500; March diagnostic BIST hardware; defect characterization; embedded memory diagnosis; fault model; industrial workflow; integrated devices; manufacturing test; production yield; Built-in self-test; Circuit faults; Costs; Design for testability; Hardware; Manufacturing industries; Manufacturing processes; Production; Silicon; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2006. ITC '06. IEEE International

Conference_Location

Santa Clara, CA

ISSN

1089-3539

Print_ISBN

1-4244-0292-1

Electronic_ISBN

1089-3539

Type

conf

DOI

10.1109/TEST.2006.297672

Filename

4079350