Title :
Embedded Memory Field Returns - Trials and Tribulations
Author :
Khare, Jitendra B. ; Shah, Amit B. ; Raman, Ashok ; Rayas, Girish
Author_Institution :
Ample Commun., Sacramento, CA
Abstract :
This paper describes efforts towards identifying and fixing the root cause of embedded memory failures in a large Ethernet chip. The solution required an active collaboration between the design house, the memory IP vendor, and the BIST solution provider
Keywords :
built-in self test; embedded systems; failure analysis; integrated circuit testing; integrated memory circuits; local area networks; BIST solution provider; Ethernet chip; design house; embedded memory failures; embedded memory field returns; memory IP vendor; Built-in self-test; Collaboration; Costs; Ethernet networks; Physical layer; Protocols; Random access memory; Telecommunication traffic; Testing; Traffic control;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0291-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297673
