Title :
Combinational Logic Soft Error Correction
Author :
Mitra, Subhasish ; Zhang, Ming ; Waqas, Saad ; Seifert, Norbert ; Gill, Balkaran ; Kim, Kee Sup
Author_Institution :
Stanford Univ., CA
Abstract :
We present two techniques for correcting radiation-induced soft errors in combinational logic - error correction using duplication, and error correction using time-shifted outputs. Simulation results show that both techniques reduce combinational logic soft error rate by more than an order of magnitude. Soft errors affecting sequential elements (latches and flip-flops) at combinational logic outputs are automatically corrected using these techniques
Keywords :
combinational circuits; error correction; integrated circuit design; logic design; radiation effects; sequential circuits; combinational logic soft error correction; flip-flops; latches; radiation-induced soft errors; sequential elements; Automatic logic units; Costs; Error analysis; Error correction; Error correction codes; Flip-flops; Logic design; Power system reliability; Protection; Redundancy;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297681