DocumentCode
3360478
Title
An enhanced high-precision and time-saving jitter transfer measurement
Author
Kho, Joseph ; Lim, Siew Goh ; Tan, Yih Ling ; Cheng, Esther ; Wong, Man On
Author_Institution
Altera Corp. (M) Sdn. Bhd., Bayan Lepas, Malaysia
fYear
2009
fDate
2-4 Dec. 2009
Firstpage
1
Lastpage
4
Abstract
As data rates increase and jitter margins decrease, the need to precisely attain the performance of a PLL block becomes increasingly important. A PLL block´s performance is reflected by its jitter transfer function, which is the ratio of output jitter to input jitter. A precise jitter transfer function requires a considerably large number of measurement points for the jitter transfer plot. The trade-off is an increase in measurement time. This paper presents a time-saving and cost effective jitter transfer measurement methodology that produces a precise jitter transfer function. This methodology extracts jitter transfer from the PLL output clock signal´s power spectrum variation. The power spectrum varies according to controlled noise injected into the PLL input clock signal. Jitter transfer experimental data show significant increase in precision and reduction in measurement time compared to the conventional methodology. This new methodology enables efficient characterization of PLL block behaviour across different loop parameters and consequently, improves time-to-market of a new device or electronic system introduction.
Keywords
jitter; phase locked loops; transfer functions; PLL block; PLL input clock signal; PLL output clock signal; enhanced high-precision jitter transfer measurement; jitter transfer function; power spectrum variation; time-saving jitter transfer measurement; Bandwidth; Clocks; Cost function; Data mining; Frequency; Instruments; Jitter; Phase locked loops; Time measurement; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Design of Advanced Packaging & Systems Symposium, 2009. (EDAPS 2009). IEEE
Conference_Location
Shatin, Hong Kong
Print_ISBN
978-1-4244-5350-4
Electronic_ISBN
978-1-4244-5351-1
Type
conf
DOI
10.1109/EDAPS.2009.5404008
Filename
5404008
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