Title :
Session 16 - Embedded memory
Author :
Noda, Kenji ; Vial, Jean-Christophe
Author_Institution :
NScore, USA
Abstract :
Penetrating into sub-tenth micron regime, variations in transistor characteristics are having a more critical impact on the design of high-density memories, such as SRAM, Flash and ROM. In this session, two papers from industry and five papers from academia will be presented.
Conference_Titel :
Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2018-6
DOI :
10.1109/CICC.2008.4672104
