DocumentCode
3360545
Title
Very-Low Voltage (VLV) and VLV Ratio (VLVR) Testing for Quality, Reliability, and Outlier Detection
Author
Roehr, Jeffrey L.
Author_Institution
Analog Devices, Wilmington, MA
fYear
2006
fDate
Oct. 2006
Firstpage
1
Lastpage
6
Abstract
A new implementation of very-low voltage (VLV) and minimum voltage (Min_Vdd) testing, the VLV ratio test (VLVR) is proposed to improve product quality and reliability by detecting fabrication and test outliers. The VLVR technique was also used to assist in the diagnosis of a stress induced failure mechanism in a 0.13 micron low power (LP) CMOS process
Keywords
CMOS integrated circuits; failure analysis; fault diagnosis; integrated circuit reliability; integrated circuit testing; low-power electronics; VLV ratio testing; low power CMOS process; minimum voltage testing; outlier detection; product quality; product reliability; stress induced failure mechanism; very-low voltage; CMOS process; Delay; Fabrication; Failure analysis; Integrated circuit testing; Low voltage; Qualifications; Random access memory; Stress; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2006. ITC '06. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
1-4244-0292-1
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2006.297690
Filename
4079368
Link To Document