DocumentCode
3360624
Title
Topology based affine invariant descriptor for MSERs
Author
Shi, Chenbo ; Wang, Guijin ; Lin, Xinggang ; Wang, Yongming ; Liao, Chao ; Miao, Quan
Author_Institution
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
fYear
2010
fDate
26-29 Sept. 2010
Firstpage
133
Lastpage
136
Abstract
This paper introduces a topology based affine invariant descriptor for maximally stable extremal regions (MSERs). The popular SIFT descriptor computes the texture information on a grey-scale patch. Instead our descriptor use only the topology and geometric information among MSERs so that features can be rapidly matched regardless of the texture in the image patch. Based on the ellipses fitting for the detected MSERs, geometric affine invariants between ellipses pair are extracted as the descriptors. Finally topology based voting selector is designed to achieve the best correspondences. Experiment shows that our descriptor is not only computational faster than SIFT descriptor, but also has better performance on wide angle of view and nonlinear illumination change. In addition, our descriptor shows a good result on multi sensor images registration.
Keywords
curve fitting; image fusion; image registration; image texture; SIFT descriptor; ellipses fitting; geometric affine invariants; geometric information; grey-scale patch; maximally stable extremal regions; multisensor images registration; nonlinear illumination; texture information; topology based affine invariant descriptor; voting selector; Context; Detectors; Geometry; Lighting; Noise; Robustness; Topology; MSER; affine transformation; local feature; topology;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location
Hong Kong
ISSN
1522-4880
Print_ISBN
978-1-4244-7992-4
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2010.5653145
Filename
5653145
Link To Document