• DocumentCode
    3360777
  • Title

    DRAM-Specific Space of Memory Tests

  • Author

    AL-Ars, Zaid ; Hamdioui, Said ; van de Goor, A. ; Gaydadjiev, Georgi ; Vollrath, Joerg

  • Author_Institution
    Fac. of Electr. Eng., Math. & Comput. Sci., Delft Univ. of Technol.
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    DRAM testing has always been theoretically considered as a subset of general memory testing, despite the disagreement of this assumption with the DRAM test practice. This paper presents a recently developed space of DRAM faults that describes the unique aspects of DRAM behavior, it validates this fault space using extensive Spice simulation, and it identifies the memory tests necessary to detect these faults. Six different tests are derived and shown to correspond to highly effective DRAM tests in practice
  • Keywords
    DRAM chips; integrated circuit testing; logic testing; DRAM faults; Spice simulation; general memory testing; memory tests; Fault detection; Fault diagnosis; Laboratories; Logic; Mathematics; Random access memory; Read-write memory; Resource description framework; Space technology; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC '06. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0292-1
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297701
  • Filename
    4079379