Title :
Multi Strobe Circuit for 2.133GHz Memory Test System
Author :
Yamamoto, Kazuhiro ; Suda, Masakatsu ; Okayasu, Toshiyuki ; Niijima, Hirokatsu ; Tanaka, Koichi
Author_Institution :
ADVANTEST Corp., Ora-gun
Abstract :
This paper presents solutions to reduce measurement error and test time in an AC characteristic test of a source-synchronous device. In order to realize such a solution, we developed a multi strobe circuit which detects a phase difference between output clock and output data at a test cycle in real time without strobe scanning. We implemented a digital delay locked loop for precise multi strobe circuit. We achieved less than 1/5 the measurement error and less than 1/16 the test time compared with the conventional test method
Keywords :
delay lock loops; integrated circuit testing; integrated memory circuits; jitter; measurement errors; 2.133 GHz; AC characteristic test; digital delay locked loop; measurement error; memory test system; multi strobe circuit; source-synchronous device; test time; Circuit testing; Clocks; Data communication; Delay; Frequency; Heating; Jitter; Measurement errors; System testing; Voltage;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297711
