A new weight set generation algorithm for weighted random pattern generation

Author

Lee, Hangkyu ; Kang, Sungho

Author_Institution

Dept. of Electr. Eng., Yonsei Univ., Seoul, South Korea

fYear

1999

fDate

1999

Firstpage

160

Lastpage

165

Abstract

In weighted random pattern testing based on deterministic test patterns, if the number of the deterministic test patterns with a low sampling probability is reduced, the number of the weighted random patterns required to achieve a high fault coverage can be decreased. The weight set that makes the variance of sampling probabilities for deterministic test patterns very small, can reduce the number of the deterministic test patterns with a low sampling probability. In this paper, we present a new weight set generation algorithm which can generate high performance weight sets by reducing the variance of the sampling probabilities. Experimental results on ISCAS-85 benchmark circuits prove the effectiveness of the new weight set generation algorithm

Keywords

built-in self test; logic testing; random number generation; BIST; ISCAS-85 benchmark circuits; deterministic test patterns; high fault coverage; weight set generation; weighted random pattern generation; AC generators; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Hardware; Logic testing; Sampling methods; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Design, 1999. (ICCD '99) International Conference on

Conference_Location

Austin, TX

ISSN

1063-6404

Print_ISBN

0-7695-0406-X

Type

conf

DOI

10.1109/ICCD.1999.808421

Filename

808421