• DocumentCode
    3361311
  • Title

    Active deskew in injection-locked clocking

  • Author

    Zhang, Lin ; Ciftcioglu, Berkehan ; Wu, Hui

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Rochester, Rochester, NY
  • fYear
    2008
  • fDate
    21-24 Sept. 2008
  • Firstpage
    567
  • Lastpage
    570
  • Abstract
    This paper presents an injection-locked clock (ILC) distribution system with a new active deskew mechanism based on the built-in phase tuning of injection-locked oscillators (ILO). The proposed technique removes the required deskew delay lines and associated power dissipation, clock latency and jitter accumulation in conventional active deskew schemes. A test chip was fabricated in a standard 0.18 mum digital CMOS process to demonstrate this new technique. Working at 3.5 GHz clock frequency, the ILOs in the ILC achieved 40 ps deskew range with a step size of 1.25 ps. The deskew loop successfully achieved a skew reduction from the preset value of 16 ps to 2 ps. The cycle-to-cycle jitter degradation from clock input to clock output is measured only 0.04 ps.
  • Keywords
    CMOS integrated circuits; circuit tuning; injection locked oscillators; jitter; active deskew mechanism; associated power dissipation; built-in phase tuning; clock latency; cycle-to-cycle jitter degradation; deskew delay lines; digital CMOS process; distribution system; injection-locked clocking; injection-locked oscillators; jitter accumulation; CMOS process; Clocks; Degradation; Delay lines; Frequency; Injection-locked oscillators; Jitter; Power dissipation; Testing; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2018-6
  • Electronic_ISBN
    978-1-4244-2019-3
  • Type

    conf

  • DOI
    10.1109/CICC.2008.4672148
  • Filename
    4672148