Managing test, yield, quality, and cost in fabless manufacturing model

Summary form only given, as follows. Consumer products have become the main technology drivers in semiconductor manufacturing and the related market pressures have made it nearly mission impossible to achieve economically viable yields within the market window. To ensure profitability, it is imperative that all major yield loss mechanisms are identified quickly and a yield loss pareto is used to prioritize yield improvement efforts. Each yield ramp presents new challenges as the random, systematic and parametric components of the yield pareto evolve over time. Chris will discuss NVIDIA´s fabless manufacturing model with emphasis on its supply chain and how it is able to support the high velocity of NVIDIA´s business. He will address the complexities of managing multiple foundries, packaging, and test houses that all must cooperate to ensure the production of high-performance, high-quality products that are simultaneously cost effective to build, yield well, ramp quickly, and do so with the highest quality.