IEEE P1687: Toward Standardized Access of Embedded Instrumentation

Author

Posse, Ken ; Crouch, Al ; Rearick, Jeff ; Eklow, Bill ; Laisne, Mike ; Bennetts, Ben ; Doege, Jason ; Ricchetti, Mike ; Cote, J.F.

fYear

2006

fDate

Oct. 2006

Firstpage

1

Lastpage

8

Abstract

The effort to standardize a methodology for accessing embedded instrumentation as IEEE PI687 continues to progress. This paper captures the current state of mind of the IJTAG working group with respect to the framework built to date and presents a discussion of other issues on which decisions are pending. The key elements of an architectural description language, a procedural language, and a hardware interface scheme are all taking shape, but still have many details to complete. Since this is a snapshot taken during the standard development process, the final form of the draft standard may differ from what is described here; any feedback to the working group is welcome

Keywords

measurement standards; IEEE P1687; architectural description language; embedded instrumentation; hardware interface scheme; procedural language; standardized access; Architecture description languages; Circuit testing; Hardware; Instruments; Logic testing; Office automation; Semiconductor devices; Shape; Standards development; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2006. ITC '06. IEEE International

Conference_Location

Santa Clara, CA

ISSN

1089-3539

Print_ISBN

1-4244-0292-1

Electronic_ISBN

1089-3539

Type

conf

DOI

10.1109/TEST.2006.297744

Filename

4079422