Title :
IEEE P1687: Toward Standardized Access of Embedded Instrumentation
Author :
Posse, Ken ; Crouch, Al ; Rearick, Jeff ; Eklow, Bill ; Laisne, Mike ; Bennetts, Ben ; Doege, Jason ; Ricchetti, Mike ; Cote, J.F.
Abstract :
The effort to standardize a methodology for accessing embedded instrumentation as IEEE PI687 continues to progress. This paper captures the current state of mind of the IJTAG working group with respect to the framework built to date and presents a discussion of other issues on which decisions are pending. The key elements of an architectural description language, a procedural language, and a hardware interface scheme are all taking shape, but still have many details to complete. Since this is a snapshot taken during the standard development process, the final form of the draft standard may differ from what is described here; any feedback to the working group is welcome
Keywords :
measurement standards; IEEE P1687; architectural description language; embedded instrumentation; hardware interface scheme; procedural language; standardized access; Architecture description languages; Circuit testing; Hardware; Instruments; Logic testing; Office automation; Semiconductor devices; Shape; Standards development; System testing;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297744
