Title :
EMI resisting smart-power integrated LIN driver with reduced slope pumping
Author :
Redouté, Jean-Michel ; Steyaert, Michiel
Author_Institution :
Dept. ESAT, MICAS, Leuven
Abstract :
This paper presents the design of a local interconnect network (LIN) smart-power driver exhibiting a high degree of immunity against electromagnetic interference (EMI). Improving previous designed architectures, this circuit switches to a low power consumption mode when there is no EMI, while presenting an increased immunity to slope pumping. Measurements illustrate that this proposed LIN driver complies to the 5 W direct power injection (DPI) specification.
Keywords :
driver circuits; electromagnetic interference; EMI resisting smart-power integrated LIN driver; direct power injection specification; electromagnetic interference; local interconnect network; reduced slope pumping; Automotive applications; Driver circuits; Electromagnetic compatibility; Electromagnetic interference; Energy consumption; Impedance; Integrated circuit interconnections; Pollution measurement; Power measurement; Propagation delay;
Conference_Titel :
Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2018-6
Electronic_ISBN :
978-1-4244-2019-3
DOI :
10.1109/CICC.2008.4672167
