DocumentCode
3361724
Title
Zero Defect Strategy for Electronic Components in Automotive Applications
Author
Glueck, Joachim ; Wagner, Ralph ; Bunz, Rainer ; Koch, Herbert ; Schmidt, Claus
Author_Institution
Robert Bosch GmbH, Reutlingen
fYear
2006
fDate
Oct. 2006
Firstpage
1
Lastpage
2
Abstract
Key challenges for components like ASICs and power semiconductors in automotive applications are introduced. The background for zero defects is highlighted. A vision of a strategy to achieve zero defects will be drawn
Keywords
application specific integrated circuits; automotive electronics; integrated circuit reliability; integrated circuit testing; power semiconductor devices; application specific integrated circuits; automotive electronic components; power semiconductors; zero defect strategy; Application specific integrated circuits; Automotive applications; Conference management; Electronic components; Production; Project management; Quality management; Software development management; Software testing; Vehicle safety;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2006. ITC '06. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
1-4244-0292-1
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2006.297756
Filename
4079434
Link To Document