Title :
Zero Defect Strategy for Electronic Components in Automotive Applications
Author :
Glueck, Joachim ; Wagner, Ralph ; Bunz, Rainer ; Koch, Herbert ; Schmidt, Claus
Author_Institution :
Robert Bosch GmbH, Reutlingen
Abstract :
Key challenges for components like ASICs and power semiconductors in automotive applications are introduced. The background for zero defects is highlighted. A vision of a strategy to achieve zero defects will be drawn
Keywords :
application specific integrated circuits; automotive electronics; integrated circuit reliability; integrated circuit testing; power semiconductor devices; application specific integrated circuits; automotive electronic components; power semiconductors; zero defect strategy; Application specific integrated circuits; Automotive applications; Conference management; Electronic components; Production; Project management; Quality management; Software development management; Software testing; Vehicle safety;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297756
