DocumentCode
3361743
Title
Zero Defects Needs Third Party Software to Succeed
Author
Scanlon, Taylor
Author_Institution
Pintail Technol., Piano, TX
fYear
2006
fDate
Oct. 2006
Firstpage
1
Lastpage
2
Abstract
The challenge of achieving zero defects cannot be achieved by semiconductor OEMs acting on their own. Semiconductor test needs to understand and embrace the role that third party vendors can play in overcoming such challenges
Keywords
electronic engineering computing; integrated circuit reliability; integrated circuit testing; semiconductor test; third party software; zero defect mission; Computer industry; Electronic design automation and methodology; Electronics industry; Manufacturing industries; Outsourcing; Semiconductor device testing; Software maintenance; Software quality; Software testing; Software tools;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2006. ITC '06. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
1-4244-0292-1
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2006.297757
Filename
4079435
Link To Document