• DocumentCode
    3361920
  • Title

    What Trends are Emerging in Microprocessor Test as CMT Architecture Scales SERDES IO to 100% Interconnect?

  • Author

    Lesnikoski, Ron

  • Author_Institution
    Sun Microsyst., Sunnyvale, CA
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The multi-core microprocessors are driving IO architecture to 100% SERDES across the processors´ memory, network and system IO interfaces. This scale of SERDES integration is that traditional DFT approaches adequately screen for functional verification of the IO macros and some amount of PHY parametrics, but fall short when used to test an integrated product with >200, 4.8 Gb/s lanes. Detailed AC parametric margin testing is still necessary to achieve adequate defect coverage
  • Keywords
    design for testability; microprocessor chips; PHY parametrics; SERDES testing; defect coverage; design for testability; functional verification; margin testing; microprocessors test; Bandwidth; Circuit testing; Costs; Design for testability; Jitter; Microprocessors; Observability; Semiconductor device measurement; Test equipment; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC '06. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0292-1
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297766
  • Filename
    4079444