DocumentCode
3361920
Title
What Trends are Emerging in Microprocessor Test as CMT Architecture Scales SERDES IO to 100% Interconnect?
Author
Lesnikoski, Ron
Author_Institution
Sun Microsyst., Sunnyvale, CA
fYear
2006
fDate
Oct. 2006
Firstpage
1
Lastpage
2
Abstract
The multi-core microprocessors are driving IO architecture to 100% SERDES across the processors´ memory, network and system IO interfaces. This scale of SERDES integration is that traditional DFT approaches adequately screen for functional verification of the IO macros and some amount of PHY parametrics, but fall short when used to test an integrated product with >200, 4.8 Gb/s lanes. Detailed AC parametric margin testing is still necessary to achieve adequate defect coverage
Keywords
design for testability; microprocessor chips; PHY parametrics; SERDES testing; defect coverage; design for testability; functional verification; margin testing; microprocessors test; Bandwidth; Circuit testing; Costs; Design for testability; Jitter; Microprocessors; Observability; Semiconductor device measurement; Test equipment; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2006. ITC '06. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
1-4244-0292-1
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2006.297766
Filename
4079444
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