• DocumentCode
    3361960
  • Title

    Fast search for worst-case test vectors for leakage current failure induced by total dose in standard-cell ASICs

  • Author

    Abdel-Aziz, H.A. ; Abou-Auf, A.A.

  • Author_Institution
    Electron. Eng. Dept., American Univ. in Cairo, Cairo, Egypt
  • fYear
    2009
  • fDate
    15-17 Nov. 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We developed a fast search algorithm for identifying worst-case test vectors for leakage current failure induced in standard-cell ASICs exposed to total-ionizing dose radiation environment.
  • Keywords
    application specific integrated circuits; integrated circuit testing; leakage currents; fast search algorithm; leakage current failure; standard-cell ASIC; total-ionizing dose radiation environment; worst-case test vectors; Leakage current; Testing; CMOS; leakage current; total dose; worst-case test vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test Workshop (IDT), 2009 4th International
  • Conference_Location
    Riyadh
  • Print_ISBN
    978-1-4244-5748-9
  • Type

    conf

  • DOI
    10.1109/IDT.2009.5404099
  • Filename
    5404099
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3361960