DocumentCode
3362164
Title
Wet chemical etching silicon wafer with low-reflection and super-hydrophobicity
Author
Lai, Wuxing ; Wang, Xiaotao ; Shi, Tielin ; Zhang, Wei ; Tang, Zirong
Author_Institution
Wuhan Nat. Lab. for Optoelectron., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear
2011
fDate
18-21 Oct. 2011
Firstpage
486
Lastpage
489
Abstract
Successful etching silicon wafer for solar cells has been already prepared. In this work, wet chemical etching process at room temperature was introduced to fabricate large-area growth of Si nanowire (SiNW) arrays. The process was carried out on p-type (100) silicon wafer in aqueous HF+AgNO3 etching solution at room temperature. The wafer surface consisting of SiNW arrays shows the characteristics of low-reflection as low as less than 5% in the 450-790 nm wavelength range. The surface also exhibits super hydrophobicity with a high water contact angle up to 150°. Si wafers with large-area SiNW arrays on the surfaces displaying properties of low-reflection and super-hydrophobicity will have potential applications for fabricating high-efficiency and self-cleaning silicon solar cells.
Keywords
contact angle; elemental semiconductors; etching; hydrophobicity; infrared spectra; nanofabrication; nanowires; reflection; semiconductor growth; silicon; visible spectra; Si; aqueous solution; infrared spectra; low reflection properties; optical properties; self-cleaning; silicon nanowire arrays; solar cells; superhydrophobicity; temperature 293 K to 298 K; water contact angle; wavelength 450 nm to 790 nm; wet chemical etching p-type (100) silicon wafer; Etching; Silicon; Surface morphology; Surface waves; Temperature; Water;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology Materials and Devices Conference (NMDC), 2011 IEEE
Conference_Location
Jeju
Print_ISBN
978-1-4577-2139-7
Type
conf
DOI
10.1109/NMDC.2011.6155275
Filename
6155275
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