Title :
On measurement systems in the IC assembly industry
Author :
Lai, Y.W. ; Duan, C.M. ; Chew, E.P.
Author_Institution :
AT&T Microelectron. Pte. Ltd, Singapore
Abstract :
This paper examines the need for and identifies approaches to development and maintaining an effective measurement system in the integrated circuit (IC) assembly industry. As the specification´s window goes narrower, the variance components in a measurement system which contribute to the measurement uncertainty are discussed. Four approaches for establishing a measurement system in the IC assembly industry is examined. A conceptual framework for effective measurement systems to manage the uncertainty in the IC assembly industry is advocated
Keywords :
assembling; integrated circuit manufacture; integrated circuit measurement; measurement errors; measurement systems; quality control; IC assembly industry; development; integrated circuit; maintenance; measurement systems; measurement uncertainty; specification; variance components; Assembly systems; Bonding; Electrical equipment industry; Integrated circuit measurements; Manufacturing industries; Manufacturing processes; Measurement uncertainty; Quality management; Software measurement; Testing;
Conference_Titel :
Engineering Management Conference, 1995. Global Engineering Management: Emerging Trends in the Asia Pacific., Proceedings of 1995 IEEE Annual International
Print_ISBN :
0-7803-2799-3
DOI :
10.1109/IEMC.1995.524618
