On measurement systems in the IC assembly industry

Author

Lai, Y.W. ; Duan, C.M. ; Chew, E.P.

Author_Institution

AT&T Microelectron. Pte. Ltd, Singapore

fYear

1995

fDate

28-30 Jun 1995

Firstpage

412

Lastpage

417

Abstract

This paper examines the need for and identifies approaches to development and maintaining an effective measurement system in the integrated circuit (IC) assembly industry. As the specification´s window goes narrower, the variance components in a measurement system which contribute to the measurement uncertainty are discussed. Four approaches for establishing a measurement system in the IC assembly industry is examined. A conceptual framework for effective measurement systems to manage the uncertainty in the IC assembly industry is advocated

Keywords

assembling; integrated circuit manufacture; integrated circuit measurement; measurement errors; measurement systems; quality control; IC assembly industry; development; integrated circuit; maintenance; measurement systems; measurement uncertainty; specification; variance components; Assembly systems; Bonding; Electrical equipment industry; Integrated circuit measurements; Manufacturing industries; Manufacturing processes; Measurement uncertainty; Quality management; Software measurement; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Engineering Management Conference, 1995. Global Engineering Management: Emerging Trends in the Asia Pacific., Proceedings of 1995 IEEE Annual International

Print_ISBN

0-7803-2799-3

Type

conf

DOI

10.1109/IEMC.1995.524618

Filename

524618