Title :
In-situ TEM biasing experiments to study thickness-dependent ferroelectric domain switching of Pb(Zr,Ti)O3 films
Author :
Shin, Gayoung ; Lee, Ho-Nyung ; Im, Jiseong ; Gu, Gil-Ho ; Oh, Sang Ho
Author_Institution :
Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), 790-784, Republic of Korea
Abstract :
We devised a novel in-situ TEM characterization technique to study the size effects in ferroelectric polarization emerging at nanometer scales. For this purpose, an in-situ TEM holder fitted to a TEM column was used, through which voltage can be applied to a Pb(Zr,Ti)O3 ferroelectric thin film. In-situ observation of the nucleation and growth behaviors of ferroelectric domains will be presented.
Keywords :
Diffraction; Education; Electrodes; Epitaxial growth; Nanoscale devices; Substrates;
Conference_Titel :
Nanotechnology Materials and Devices Conference (NMDC), 2011 IEEE
Conference_Location :
Jeju
Print_ISBN :
978-1-4577-2139-7
DOI :
10.1109/NMDC.2011.6155296
