• DocumentCode
    3362826
  • Title

    Analysis of IPM current oscillation under short circuit condition

  • Author

    Takei, M. ; Minoya, Y. ; Kumagai, N. ; Sakurai, K.

  • Author_Institution
    Fuji Electr. Co. Ltd., Nagano, Japan
  • fYear
    1998
  • fDate
    3-6 Jun 1998
  • Firstpage
    89
  • Lastpage
    93
  • Abstract
    It is observed that the collector current in an IGBT oscillates under short circuit conditions. In particular, severe oscillation occurs when the IGBT is connected to a current limiting circuit. This current oscillation has some undesirable effects on application circuits using IGBTs or IPMs (intelligent power modules). We have revealed the current oscillation mechanism by means of experiments and simulation. From the results, the IGBT cell structure itself triggers oscillation of the gate voltage and collector current. The parasitic inductance existing in the module and the current limiting circuit connected to the IGBT have an additional influence on the current oscillation behaviour. Current oscillation can be damped successfully by adjusting the parasitic inductance or improving the properties of the current limiting circuit
  • Keywords
    current fluctuations; current limiters; insulated gate bipolar transistors; integrated circuit packaging; modules; oscillations; power bipolar transistors; power integrated circuits; short-circuit currents; IGBT cell structure; IGBT collector current oscillation; IGBTs; IPM current oscillation; application circuits; collector current oscillation; current limiting circuit; current oscillation behaviour; current oscillation damping; current oscillation mechanism; gate voltage oscillation; intelligent power modules; parasitic inductance; short circuit condition; short circuit conditions; simulation; Circuit noise; Circuit simulation; Current limiters; Current measurement; Driver circuits; Inductance; Insulated gate bipolar transistors; Semiconductor device measurement; Surge protection; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1998. ISPSD 98. Proceedings of the 10th International Symposium on
  • Conference_Location
    Kyoto
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-4752-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.1998.702642
  • Filename
    702642