• DocumentCode
    3362944
  • Title

    A localized symplectic model reduction technique for parameterized Hamiltonian systems

  • Author

    Liqian Peng ; Mohseni, Kamran

  • Author_Institution
    Dept. of Mech. & Aerosp. Eng., Univ. of Florida, Gainesville, FL, USA
  • fYear
    2015
  • fDate
    1-3 July 2015
  • Firstpage
    5545
  • Lastpage
    5550
  • Abstract
    In this article, a localized symplectic model reduction technique, locally weighted proper symplectic decomposition (LWPSD), is proposed to simplify parameterized Hamiltonian systems. Our aim is two-fold. First, to achieve computational savings for large-scale Hamiltonian systems with parameter variation. Second, to preserve the symplectic structure of the original system. As an analogy to the proper orthogonal decomposition, the proper symplectic decomposition (PSD) can be used to construct a symplectic subspace to fit empirical data, and yield a low-order Hamiltonian system on the subspace. Instead of using a global basis to construct a global reduced model, the locally weighted approach approximates the original system by multiple lower-dimensional subspaces. Each local reduced basis is generated by the PSD of a weighted snapshot ensemble. Compared with the standard PSD, the LWPSD could yield a more accurate solution with a fixed subspace dimension. The stability, accuracy, and efficiency of the proposed technique are illustrated through the numerical simulation of the wave equation.
  • Keywords
    large-scale systems; reduced order systems; stability; wave equations; LWPSD; global reduced model; large-scale Hamiltonian systems; localized symplectic model reduction technique; locally weighted proper symplectic decomposition; low-order Hamiltonian system; parameterized Hamiltonian systems; proper orthogonal decomposition; stability; wave equation; weighted snapshot ensemble; Computational modeling; Mathematical model; Method of moments; Propagation; Reduced order systems; Time-domain analysis; Trajectory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2015
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4799-8685-9
  • Type

    conf

  • DOI
    10.1109/ACC.2015.7172207
  • Filename
    7172207