DocumentCode :
3363374
Title :
Area, performance, and yield implications of redundancy in on-chip caches
Author :
Thomas, Tom ; Anthony, Brian
Author_Institution :
Motorola Inc., Austin, TX, USA
fYear :
1999
fDate :
1999
Firstpage :
291
Lastpage :
292
Abstract :
To meet increasing system performance demands, microprocessor designers continue to expand the amount of cache memory integrated on the processor die. The resulting additional silicon area has the undesirable effects of reducing die yield and increasing die cost. Adding redundancy to the on-chip caches can mitigate the reduced yield but introduces additional penalties in die area and performance. The paper evaluates the area, performance, and yield impact of several different implementations of on-chip cache redundancy in the context of the next member of Motorola´s G4 generation of PowerPCTM processors (N. Iyengar, 1999)
Keywords :
cache storage; microprocessor chips; redundancy; Motorola G4 generation; PowerPC processors; cache memory; die area; die cost; die yield; microprocessor design; on-chip cache redundancy; processor die; silicon area; system performance demands; yield impact; yield implications; Cache memory; Circuits; Equations; Microprocessors; Process design; Random access memory; Semiconductor device manufacture; Silicon; System performance; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design, 1999. (ICCD '99) International Conference on
Conference_Location :
Austin, TX
ISSN :
1063-6404
Print_ISBN :
0-7695-0406-X
Type :
conf
DOI :
10.1109/ICCD.1999.808551
Filename :
808551
Link To Document :
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