• DocumentCode
    3363374
  • Title

    Area, performance, and yield implications of redundancy in on-chip caches

  • Author

    Thomas, Tom ; Anthony, Brian

  • Author_Institution
    Motorola Inc., Austin, TX, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    291
  • Lastpage
    292
  • Abstract
    To meet increasing system performance demands, microprocessor designers continue to expand the amount of cache memory integrated on the processor die. The resulting additional silicon area has the undesirable effects of reducing die yield and increasing die cost. Adding redundancy to the on-chip caches can mitigate the reduced yield but introduces additional penalties in die area and performance. The paper evaluates the area, performance, and yield impact of several different implementations of on-chip cache redundancy in the context of the next member of Motorola´s G4 generation of PowerPCTM processors (N. Iyengar, 1999)
  • Keywords
    cache storage; microprocessor chips; redundancy; Motorola G4 generation; PowerPC processors; cache memory; die area; die cost; die yield; microprocessor design; on-chip cache redundancy; processor die; silicon area; system performance demands; yield impact; yield implications; Cache memory; Circuits; Equations; Microprocessors; Process design; Random access memory; Semiconductor device manufacture; Silicon; System performance; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design, 1999. (ICCD '99) International Conference on
  • Conference_Location
    Austin, TX
  • ISSN
    1063-6404
  • Print_ISBN
    0-7695-0406-X
  • Type

    conf

  • DOI
    10.1109/ICCD.1999.808551
  • Filename
    808551