• DocumentCode
    3363501
  • Title

    MRAM Memory for Embedded and Stand Alone Systems

  • Author

    Durlam, M. ; Chung, Y. ; DeHerrera, M. ; Engel, B.N. ; Grynkewich, G. ; Martino, B. ; Nguyen, B. ; Salter, J. ; Shah, P. ; Slaughter, J.M.

  • Author_Institution
    Freescale Semicond. Inc., Chandler
  • fYear
    2007
  • fDate
    May 30 2007-June 1 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Magnetoresistive random access memory (MRAM) is based on magnetic tunnel junction devices integrated with standard CMOS resulting in high-speed read and write, unlimited endurance, and the highest reliability of any non-volatile memory. MRAM is a unique memory technology in that the module is inserted late in the manufacturing process, making MRAM highly compatible with advanced processing. The manufacturing flexibility of MRAM makes it an attractive choice for embedded and stand alone memory systems.
  • Keywords
    CMOS memory circuits; embedded systems; integrated circuit reliability; magnetic storage; magnetic tunnelling; magnetoelectronics; magnetoresistive devices; random-access storage; CMOS; MRAM memory; embedded systems; magnetic tunnel junction devices; magnetoresistive random access memory; manufacturing flexibility; nonvolatile memory reliability; stand alone systems; CMOS technology; Magnetic devices; Magnetic flux; Magnetic semiconductors; Magnetic tunneling; Manufacturing processes; Nonvolatile memory; Polarization; Read-write memory; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuit Design and Technology, 2007. ICICDT '07. IEEE International Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    1-4244-0757-5
  • Electronic_ISBN
    1-4244-0757-5
  • Type

    conf

  • DOI
    10.1109/ICICDT.2007.4299546
  • Filename
    4299546