On-line BIST for testing analog circuits

Author

Velasco-Medina, J. ; Rayane, I. ; Nicolaidis, M.

Author_Institution

Reliable Integrated Syst. Group, TIMA/INPG, Grenoble, France

fYear

1999

fDate

1999

Firstpage

330

Lastpage

332

Abstract

In this paper, we present a new online built-in self-test (BIST) approach for testing analog circuits. It uses a current window comparator and current-based checker circuits for processing the test response of the analog parts in mixed-signal integrated circuits. Online analog BIST capability is achieved by using high-speed current-mode circuits. A leapfrog filter has been considered as a test vehicle, and simulation results show the feasibility and effectiveness of the proposed BIST approach

Keywords

analogue circuits; built-in self test; circuit simulation; circuit testing; current-mode circuits; online operation; BIST; analogue circuit testing; current window comparator; current-based checker circuits; high-speed current-mode circuits; leapfrog filter; mixed-signal integrated circuits; online built-in self-test; simulation; test response processing; Analog circuits; Automatic testing; Built-in self-test; Circuit simulation; Circuit testing; Current mode circuits; Filters; Integrated circuit testing; Mixed analog digital integrated circuits; Vehicles;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Design, 1999. (ICCD '99) International Conference on

Conference_Location

Austin, TX

ISSN

1063-6404

Print_ISBN

0-7695-0406-X

Type

conf

DOI

10.1109/ICCD.1999.808563

Filename

808563