Title :
On detecting bridges causing timing failures
Author :
Mandava, Sreenivas ; Chakravarty, Sreejit ; Kundu, Sandip
Author_Institution :
Microprocessor Products Group, Intel Corp., Santa Clara, CA, USA
Abstract :
High resistance bridges (resistive bridges) are becoming more common. Such bridges cause speed failures. Published experimental results show that current tests are not good at detecting such defects. The following results, pertinent to resolving the above issue, are presented: mechanisms by which bridges cause speed failure; identification of non-classical transition tests for such bridges; and the usefulness and pitfalls of using low voltage testing to detect such bridges
Keywords :
bridge circuits; circuit simulation; circuit testing; bridge detection; high resistance bridges; low voltage testing; non-classical transition tests; resistive bridges; speed failures; timing failures; Analytical models; Bridge circuits; Computational modeling; Degradation; Delay; Logic testing; Low voltage; Microprocessors; SPICE; Timing;
Conference_Titel :
Computer Design, 1999. (ICCD '99) International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7695-0406-X
DOI :
10.1109/ICCD.1999.808573
