DocumentCode
3363957
Title
Flexible field emission devices using transparent ZnO nanowires on reduced graphene films
Author
Lee, Kyung Eun ; Hwang, Jin Ok ; Kim, Sang Ouk
Author_Institution
Korea Adv. Inst. of Sci. & Tehcnology, Daejeon, South Korea
fYear
2011
fDate
18-21 Oct. 2011
Firstpage
303
Lastpage
307
Abstract
We present a transparent and flexible optoelectronic material composed of vertically aligned ZnO NWs grown on reduced graphene/PDMS substrates. Large-area reduced graphene films were prepared on PDMS substrates by chemical exfoliation from natural graphite via oxidative aqueous dispersion and subsequent thermal reduction. ZnO NWs were hydrothermally grown on the reduced grapheme film substrate and maintained their structural uniformity even in highly deformed states. The electrical contact between semiconducting ZnO NWs and the metallic graphene film was straightforwardly measured by electric force microscopy (EFM). It shows a typical metal-semiconductor ohmic contact without a contact barrier. Owing to the mechanical flexibility, transparency, and low contact barrier, the ZnO NWs/graphene hybrids show excellent field emission properties. Low turn-on field values of 2.0 V mm-1, 2.4 V mm-1, and 2.8 V mm-1 were measured for convex, flat, and concave deformations, respectively. Such variation of field emission properties were attributed to the modification of ZnO NWs emitter density upon mechanical deformation.
Keywords
II-VI semiconductors; deformation; field emission; nanoelectronics; nanowires; ohmic contacts; semiconductor-metal boundaries; thin film devices; transparency; wide band gap semiconductors; zinc compounds; C; ZnO-C; chemical exfoliation; concave deformations; contact barrier; convex deformations; electric force microscopy; electrical contact; flat deformations; flexible field emission devices; hydrothermal growth; mechanical deformation; mechanical flexibility; metal-semiconductor ohmic contact; metallic graphene film; natural graphite; oxidative aqueous dispersion; reduced graphene film-PDMS substrates; semiconducting nanowires; structural uniformity; thermal reduction; transparent flexible optoelectronic material; transparent nanowires; turn-on field values; Electrodes; Films; Shape; Shape measurement; Silicon; Substrates; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology Materials and Devices Conference (NMDC), 2011 IEEE
Conference_Location
Jeju
Print_ISBN
978-1-4577-2139-7
Type
conf
DOI
10.1109/NMDC.2011.6155365
Filename
6155365
Link To Document