Title :
Total Ionizing Dose Effects in Switched-Capacitor Filters using Oscillation-Based Test
Author :
Espinosa-Duran, John M. ; Velasco-Medina, Jaime ; Huertas, Gloria ; Huertas, Jose L.
Author_Institution :
Univ. del Valle, Cali
Abstract :
This paper studies long-term effects produced by ionizing radiation in a switched-capacitor filter, using the Oscillation Based Test (OBT) approach [1]. In this case, threshold voltage shifting is considered as one of the major concerning effects produced by Total Ionizing Dose (TID). Simulation results show that the OBT approach is very well suited for detection of faulty filters.
Keywords :
radiation hardening (electronics); switched capacitor filters; ionizing radiation; oscillation-based test; switched-capacitor filter; threshold voltage shifting; total ionizing dose effect; Analog circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Filters; Ionizing radiation; Threshold voltage; Oscillation Based Test (OBT); Radiation Effects; Switched-Capacitor Circuits; Total Ionizing Dose (TID);
Conference_Titel :
Electronics, Circuits and Systems, 2007. ICECS 2007. 14th IEEE International Conference on
Conference_Location :
Marrakech
Print_ISBN :
978-1-4244-1377-5
Electronic_ISBN :
978-1-4244-1378-2
DOI :
10.1109/ICECS.2007.4511122
