DocumentCode :
3364974
Title :
Composite MLCCs with X7R characteristics
Author :
Gui, Zhilun ; Cai, Hong ; Li, Longtu
Author_Institution :
Dept. of Mater. Sci. & Eng., Tsinghua Univ., Beijing, China
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
821
Abstract :
The low-sintering composite multilayer ceramic capacitors (CMLCCs) having K-value in excess of 7200 with X7R characteristics (-55~+125°C, ±15%) have been successfully developed. The CMLCCs incorporate four PMN-PNN-PT or PMN-PT based ceramics with different Curie temperatures as the principal components. The green tapes and inner electrodes are stacked during green printing according to a certain order and cofired to prepare this kind of multi-material multilayer chip component. According to the parallel-connecting model of capacitance, the dielectric constant (K) of CMLCC can be approximately determined by the proportion of four dielectrics with different Curie temperatures. The small difference between the calculative curve and testing curve can be explained by the mutual diffusion among different dielectrics via the inner electrode. The research results show that it is feasible to produce chip components with high performance by cofiring multi-phases materials
Keywords :
ceramic capacitors; ferroelectric Curie temperature; ferroelectric capacitors; ferroelectric ceramics; permittivity; sintering; -55 to 125 C; Curie temperatures; K-value; PMN-PNN-PT based ceramics; PMN-PT based ceramics; X7R characteristics; composite MLCCs; dielectric constant; dielectrics; green tapes; inner electrode; low-sintering multilayer ceramic capacitors; multi-material multilayer chip component; mutual diffusion; parallel connecting model of capacitance; stacked; Capacitance; Capacitors; Ceramics; Dielectric constant; Dielectric materials; Electrodes; Nonhomogeneous media; Printing; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
Conference_Location :
Honolulu, HI
ISSN :
1099-4734
Print_ISBN :
0-7803-5940-2
Type :
conf
DOI :
10.1109/ISAF.2000.942444
Filename :
942444
Link To Document :
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