• DocumentCode
    3364983
  • Title

    Study on structure and properties of X7R ceramics based on BaTiO 3 with high dielectric constants

  • Author

    Li, Longtu ; Chen, Renzheng ; Wang, Xiaohui ; Gui, Zhilun

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Tsinghua Univ., Beijing, China
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    825
  • Abstract
    Microstructures and dielectric properties of BaTiO3-based X7R ceramics were studied. The dielectric constant at room temperature is about 4600, and the dielectric loss is 10-2. The resistance is over 1012Ω·cm and TCC is less than ±15%. Under bias voltage, TCC is less than 13%. Therefore the materials meet EIA X7R specifications. The microstructures were studied by SEM and TEM. Inhomogeneous compositional distributions within the grains were observed that consisted of two main parts, each possessing a different temperature dependence of the dielectric constant. Multilayer capacitors were fabricated and showed outstanding performances. Dielectric constants of 5100 were achieved and components have passed the life test at 125°C for 1000 hr
  • Keywords
    barium compounds; ceramic capacitors; ceramics; dielectric losses; dielectric materials; permittivity; scanning electron microscopy; transmission electron microscopy; 125 C; BaTiO3; SEM; TCC; TEM; X7R ceramic; barium titanate; bias voltage; composition distribution; dielectric constant; dielectric loss; dielectric properties; electrical resistance; life testing; microstructure; multilayer ceramic capacitor; temperature dependence; Capacitors; Ceramics; Dielectric constant; Dielectric losses; Dielectric materials; Life testing; Microstructure; Nonhomogeneous media; Temperature dependence; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-5940-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2000.942445
  • Filename
    942445