DocumentCode
3364991
Title
Investigation on decap shift and incomplete fill issues in the wafer level compression molding process
Author
Lin Bu ; Siowling Ho ; Dexter Velez, Sorono ; Boyu Zheng ; Ser Choong Chong ; Booyang Jung ; Taichong Chai ; Xiaowu Zhang
Author_Institution
Inst. of Microelectron., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
fYear
2013
fDate
11-13 Dec. 2013
Firstpage
766
Lastpage
770
Abstract
Decaps are the panacea to cure the noise related issues. Due to the short distance advantage, decaps were embedded in the package instead of PCB. These decaps, generally having higher thickness than chips, would play a vital role in the wafer level molding process. Improper population will cause decap shift and incomplete fill issues. In the present paper, proper arrangement of decaps were designed and optimized. The results show that decaps placed along two adjacent sides rather than two opposite sides of the chip would result in better filling. In order to further reduce the drag force on decaps, chip to decap distance should be as large as possible. This implies that narrow gaps would result in higher drag force. Therefore, narrow gaps should be avoided to ease the drag force in the package as well as the whole wafer.
Keywords
compression moulding; printed circuits; PCB; decap shift; drag force; incomplete fill issues; wafer level compression molding process; Conferences; Decision support systems; Electronics packaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
Conference_Location
Singapore
Print_ISBN
978-1-4799-2832-3
Type
conf
DOI
10.1109/EPTC.2013.6745824
Filename
6745824
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