Title :
Influence of cyclic mechanical and electrical load on the properties of PZT(53/47) films on metallic substrates
Author :
Hauke, T. ; Beige, H. ; Giersbach, M. ; Seifert, S. ; Sporn, D.
Author_Institution :
FB Phys., Martin-Luther-Universitat Halle-Wittenberg, Halle, Germany
Abstract :
We have investigated the mechanical and electrical fatigue of sol-gel derived PZT(53/47) thin films on metallic substrates: Up to about 5 × 105 electrical switching cycles, no significant changes were found. Above this number the coercive field increased drastically and the maximum induced strain as well as the maximum and remanent polarization decreased. For the mechanical cycling, a two point bending method was used to apply transversal stress to the samples. A mechanical cyclic load corresponding to a maximum strain of ±0,15% was applied to the films. During cycling the piezoelectric coefficient d31 remained constant up to about 105 cycles. For a higher number of cycles, a strong decrease was observed. The decrease of the d31-values was not caused by a depolarization of the samples. Different mechanisms, which may be responsible for the deterioration of the properties during both, electrical and mechanical cycling are discussed
Keywords :
fatigue; ferroelectric thin films; lead compounds; piezoelectric thin films; sol-gel processing; PZT; PZT ferroelectric thin film; PbZrO3TiO3; coercive field; electrical cycling; electrical fatigue; electrical switching; mechanical cycling; mechanical fatigue; metallic substrate; piezoelectric coefficient; remanent polarization; sol-gel synthesis; two point bending method; Capacitive sensors; Ceramics; Dielectric measurements; Dielectric substrates; Electrodes; Fatigue; Ferroelectric materials; Mechanical factors; Stress; Transistors;
Conference_Titel :
Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-5940-2
DOI :
10.1109/ISAF.2000.942462