DocumentCode :
3365490
Title :
Energy scavenging from vibration with two-layer laminated fluoroethylenepropylene piezoelectret films
Author :
Xiaoqing Zhang ; Liming Wu ; Sessler, Gerhard M.
Author_Institution :
Sch. of Phys. Sci. & Eng., Tongji Univ., Shanghai, China
fYear :
2015
fDate :
24-27 May 2015
Firstpage :
24
Lastpage :
27
Abstract :
Fluoroethylenepropylene (FEP) piezoelectret films with a cross-tunnel structure were prepared using a template-based process and contact charging. Energy harvesting from the fabricated FEP films was investigated in the {3-3} mode at various seismic masses, load resistances and exciting frequencies. The results show that the output power is dependent on the seismic mass, load resistance and vibration frequency. Around the optimum load resistance, a normalized output power of 73 μW at 130 Hz was obtained for an FEP piezolectret film with a seismic mass of 60 g and an area of 7.1 cm2. At a vibration frequency of 150 Hz, the output power from an FEP film sample with an excited area of 3.1 cm2 and a seismic mass of 54 g, is high enough to light a blue color LED diode, showing such thin, light and flexible FEP piezoelectret films may be applied in environmental vibration energy harvesters for powering low-power electronic devices.
Keywords :
electrets; electric resistance; energy harvesting; laminates; organic compounds; piezoelectric thin films; vibrations; contact charging; cross-tunnel structure; energy scavenging; exciting frequencies; frequency 130 Hz to 150 Hz; load resistances; mass 60 g to 54 g; output power; power 73 muW; seismic masses; template-based process; two-layer laminated fluoroethylenepropylene piezoelectret films; vibration frequency; {3-3} mode; Energy harvesting; Films; Force; Power generation; Resistance; Resonant frequency; Vibrations; Vibration energy harvesting; fluoroethylenepropylene; piezoelectret;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectric, International Symposium on Integrated Functionalities and Piezoelectric Force Microscopy Workshop (ISAF/ISIF/PFM), 2015 Joint IEEE International Symposium on the
Conference_Location :
Singapore
Type :
conf
DOI :
10.1109/ISAF.2015.7172659
Filename :
7172659
Link To Document :
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