• DocumentCode
    3365565
  • Title

    Preparation of wafer-level LED packaging used uniform micro glass cavities by an improved Chemical Foaming Process (CFP)

  • Author

    Yu Zou ; Jintang Shang ; Yu Ji ; Li Zhang ; Chiming Lai ; Dong Chen ; Kim-Hui Chen

  • Author_Institution
    Key Lab. of MEMS of Minist. of Educ., Southeast Univ., Nanjing, China
  • fYear
    2013
  • fDate
    11-13 Dec. 2013
  • Firstpage
    887
  • Lastpage
    890
  • Abstract
    Micro glass cavity has very important research values in many fields including Lighting Emitting Diode (LED) packaging, atomic devices, MEMS packaging and so on. In this study, an improved Chemical Foaming Process (CFP) have been investigated and uniform wafer-level micro glass cavities, which could be used in wafer-level LED packaging, have been prepared successfully by the proposed process. First of all, the fabrication process is introduced. Then the prepared uniform wafer-level semispherical glass cavity has been characterized by Atomic Force Microscopy (AFM) and mechanical shock test. And the result shows that the surface roughness of glass cavity is quite smooth which suits for optical applications as well as many other applications. At last, LED chip packaged with semispherical micro glass cavity on silicon substrate is presented.
  • Keywords
    atomic force microscopy; chip scale packaging; glass; light emitting diodes; microcavities; silicon; surface roughness; wafer level packaging; AFM; CFP; LED chip packaging; MEMS packaging; Si; atomic devices; atomic force microscopy; chemical foaming process; lighting emitting diode packaging; mechanical shock test; semispherical microglass cavity; surface roughness; uniform wafer-level microglass cavities; wafer-level LED packaging; Cavity resonators; Glass; Light emitting diodes; Packaging; Rough surfaces; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4799-2832-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2013.6745850
  • Filename
    6745850