DocumentCode :
3365695
Title :
Automated detection of blob structures by Hessian analysis and object scale
Author :
Liu, Jiamin ; White, Jacob M. ; Summers, Ronald M.
Author_Institution :
Dept. of Radiol. & Imaging Sci., Nat. Institutes of Health Clinical Center, Bethesda, MD, USA
fYear :
2010
fDate :
26-29 Sept. 2010
Firstpage :
841
Lastpage :
844
Abstract :
Automated detection of blob-like structures is desirable in many biomedical applications such as nodule detection in radiographs and CT images, lymph nodes detection in CT images, and cell counting or tracking in biological images. Multiscale analysis of Hessian matrix is widely used for enhancement or detection of blob-like structures in two-dimensional (2D) and three-dimensional (3D) images. We proposed a new blob detector and a new detection response measure, blobness, based on eigenvalues of the Hessian matrix and local object scale. Pixels with higher blobness are clustered as detected blobs. We evaluated our method by comparison with two existing methods on both simulated and real images. Our results indicated that our automated blob detector had better performance on those images especially when the blobs were close to each other. Our method can be easily extended to 3D for computer-aided detection of blob-like structures in medical images.
Keywords :
Hessian matrices; computerised tomography; image recognition; medical image processing; CT image; Hessian analysis; Hessian matrix; automated blob detector; biological image tracking; biomedical application; blob like structures enhancement; blob structures automated detection; computer aided detection; lymph node detection; medical images; multiscale analysis; nodule detection; radiographs; three dimensional images; two dimensional images; Computed tomography; Eigenvalues and eigenfunctions; Lymph nodes; Medical diagnostic imaging; Pixel; Three dimensional displays; Hessian matrix; blob detection; object scale;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
ISSN :
1522-4880
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2010.5653499
Filename :
5653499
Link To Document :
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