DocumentCode :
3365832
Title :
Mitigating soft errors in SRAM-based FPGAs by using large grain TMR with selective partial reconfiguration
Author :
Azambuja, José Rodrigo ; Pilotto, Conrado ; Kastensmidt, Fernanda Lima
Author_Institution :
Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
fYear :
2008
fDate :
10-12 Sept. 2008
Firstpage :
288
Lastpage :
293
Abstract :
This work presents a method that allows dynamic partial reconfiguration with triple modular redundancy in SRAM-based FPGAs fault-tolerant designs. Experimental results show reduced time and energy in fault recovery compared to XTMR with scrubbing.
Keywords :
SRAM chips; fault tolerance; field programmable gate arrays; logic design; FPGA; SRAM; dynamic partial reconfiguration; fault recovery; fault-tolerant design; selective partial reconfiguration; soft error mitigation; triple modular redundancy; Dynamic Partial Reconfiguration; FPGA; TMR; fault tolerance; soft errors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location :
Jyvaskyla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0481-9
Type :
conf
DOI :
10.1109/RADECS.2008.5782729
Filename :
5782729
Link To Document :
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