Title :
Using FLIPPER to predict irradiation results for VIRTEX 2 devices
Author :
Alderighi, M. ; Casini, F. ; Citterio, M. ; Angelo, S.D. ; Mancini, M. ; Pastore, S. ; Sechi, G.R. ; Sorrenti, G.
Author_Institution :
Ist. Naz. di Astrofis., Ist. di Astrofis. Spaziale e Fis. Cosmica, Milan, Italy
Abstract :
The comparison between FLIPPER fault injection experiment and radiation ground-testing on selected SRAM-FPGA designs is presented in the paper. The excellent agreement represents a significant achievement toward the validation of the FLIPPER platform.
Keywords :
SRAM chips; field programmable gate arrays; FLIPPER fault injection; FLIPPER platform; SRAM-FPGA design; VIRTEX 2 device; irradiation prediction; radiation ground-testing; Circuit faults; Field programmable gate arrays; Hardware; Protons; Radiation effects; Single event upset; Testing; Fault Injection; Field Programmable Gate Array (FPGA); Radiation Ground Testing; Single Event Effects;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location :
Jyvaskyla
Print_ISBN :
978-1-4577-0481-9
DOI :
10.1109/RADECS.2008.5782731
