DocumentCode :
3365899
Title :
Nonlinear measurements of piezocomposite transducers with burst excitation
Author :
Albareda, A. ; Casals, J.A. ; Pérez, R. ; Montero de Espinos, F.
Author_Institution :
Dept. de Fisica Aplicada, Univ. Politecnica de Catalunya, Barcelona, Spain
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
979
Abstract :
Resonant transducers made with composites and excited by burst signals are used in high power applications, where the spatial resolution is important, such as non-destructive testing (NDT) or medical applications. The characterization of nonlinear resonant behavior must be carried out in similar conditions as in the device application: the same pulsed signal and excitation level. A new measurement method is presented, without the use of typical network or impedance analyzer that carries out measurements with steady state signals. The measurement of the transient response of the current flowing in the piezocomposite transducer after the end of a burst signal excitation allows us to measure the mechanical loss tangent tan δ m and shift frequency, versus the amplitude level. This method enables us to measure this nonlinear behavior without overheating the transducers; it also extends the level amplitudes of the previous nonlinear behavior methods
Keywords :
composite materials; electric variables measurement; nondestructive testing; piezoelectric transducers; transient response; ultrasonic transducers; burst excitation; high power applications; mechanical loss tangent; nondestructive testing; nonlinear measurements; nonlinear resonant behavior; piezocomposite transducers; resonant transducers; shift frequency; spatial resolution; transient current response; Biomedical transducers; Current measurement; Frequency measurement; Impedance measurement; Loss measurement; Mechanical variables measurement; Medical tests; Nondestructive testing; Resonance; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
Conference_Location :
Honolulu, HI
ISSN :
1099-4734
Print_ISBN :
0-7803-5940-2
Type :
conf
DOI :
10.1109/ISAF.2000.942496
Filename :
942496
Link To Document :
بازگشت