• DocumentCode
    3365911
  • Title

    Reduced-reference SSIM estimation

  • Author

    Rehman, Akif ; Wang, Zhou

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
  • fYear
    2010
  • fDate
    26-29 Sept. 2010
  • Firstpage
    289
  • Lastpage
    292
  • Abstract
    The structural similarity (SSIM) index has been shown to be a good perceptual image quality predictor. In many real-world applications such as network visual communications, however, SSIM is not applicable because its computation requires full access to the original image. Here we propose a reduced-reference approach that estimates SSIM with only partial information about the original image. Specifically, we extract statistical features from a multi-scale, multi-orientation divisive normalization transform and develop a distortion measure by following the philosophy analogous to that in the construction of SSIM. We found an interesting linear relationship between our reduced-reference SSIM estimate and full-reference SSIM when the image distortion type is fixed. A regression-by-discretization method is then applied to normalize our measure between image distortion types. We use the LIVE database to test the proposed distortion measure, which shows strong correlations with both SSIM and subjective evaluations. We also demonstrate how our reduced-reference features may be employed to partially repair a distorted image.
  • Keywords
    estimation theory; image processing; visual perception; SSIM estimation; perceptual image quality predictor; reduced-reference approach; structural similarity index; Databases; Distortion measurement; Estimation; Feature extraction; Image quality; Nonlinear distortion; Transforms; divisive normalization transform; image repairing; natural image statistics; reduced-reference image quality assessment; regression by discretization; structural similarity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2010 17th IEEE International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-7992-4
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2010.5653508
  • Filename
    5653508