• DocumentCode
    3366008
  • Title

    Analysis of CCD dark current degradation in orbit

  • Author

    Penquer, A. ; Boutillier, M. ; Rolland, G. ; Gilard, O.

  • Author_Institution
    Centre Nat. d´´Etudes Spatiales (CNES), Toulouse, France
  • fYear
    2008
  • fDate
    10-12 Sept. 2008
  • Firstpage
    344
  • Lastpage
    349
  • Abstract
    This paper presents the CNES analysis of CCD dark current degradation in orbit. For the first time, data coming from several detectors in orbit have been collected and congregated to extract general trends about in-flight detector behaviours. The in-orbit degradation is therefore compared to the on-ground prediction for each detector. This work has been done in collaboration with the CNES detection subsystem office, the CNES image quality office and the CNES components & environment effects office.
  • Keywords
    charge-coupled devices; radiation effects; space vehicle electronics; CCD dark current degradation; CCD detectors; CNES analysis; CNES components; CNES detection subsystem office; CNES image quality office; charge coupled device detectors; in-flight detector; in-orbit degradation; radiation effects; Charge coupled devices; Dark current; Degradation; Detectors; Orbits; Pixel; Protons; CCD; DSNU; Dark Current; Radiation Damage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
  • Conference_Location
    Jyvaskyla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0481-9
  • Type

    conf

  • DOI
    10.1109/RADECS.2008.5782740
  • Filename
    5782740