DocumentCode :
3366008
Title :
Analysis of CCD dark current degradation in orbit
Author :
Penquer, A. ; Boutillier, M. ; Rolland, G. ; Gilard, O.
Author_Institution :
Centre Nat. d´´Etudes Spatiales (CNES), Toulouse, France
fYear :
2008
fDate :
10-12 Sept. 2008
Firstpage :
344
Lastpage :
349
Abstract :
This paper presents the CNES analysis of CCD dark current degradation in orbit. For the first time, data coming from several detectors in orbit have been collected and congregated to extract general trends about in-flight detector behaviours. The in-orbit degradation is therefore compared to the on-ground prediction for each detector. This work has been done in collaboration with the CNES detection subsystem office, the CNES image quality office and the CNES components & environment effects office.
Keywords :
charge-coupled devices; radiation effects; space vehicle electronics; CCD dark current degradation; CCD detectors; CNES analysis; CNES components; CNES detection subsystem office; CNES image quality office; charge coupled device detectors; in-flight detector; in-orbit degradation; radiation effects; Charge coupled devices; Dark current; Degradation; Detectors; Orbits; Pixel; Protons; CCD; DSNU; Dark Current; Radiation Damage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location :
Jyvaskyla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0481-9
Type :
conf
DOI :
10.1109/RADECS.2008.5782740
Filename :
5782740
Link To Document :
بازگشت