DocumentCode
3366008
Title
Analysis of CCD dark current degradation in orbit
Author
Penquer, A. ; Boutillier, M. ; Rolland, G. ; Gilard, O.
Author_Institution
Centre Nat. d´´Etudes Spatiales (CNES), Toulouse, France
fYear
2008
fDate
10-12 Sept. 2008
Firstpage
344
Lastpage
349
Abstract
This paper presents the CNES analysis of CCD dark current degradation in orbit. For the first time, data coming from several detectors in orbit have been collected and congregated to extract general trends about in-flight detector behaviours. The in-orbit degradation is therefore compared to the on-ground prediction for each detector. This work has been done in collaboration with the CNES detection subsystem office, the CNES image quality office and the CNES components & environment effects office.
Keywords
charge-coupled devices; radiation effects; space vehicle electronics; CCD dark current degradation; CCD detectors; CNES analysis; CNES components; CNES detection subsystem office; CNES image quality office; charge coupled device detectors; in-flight detector; in-orbit degradation; radiation effects; Charge coupled devices; Dark current; Degradation; Detectors; Orbits; Pixel; Protons; CCD; DSNU; Dark Current; Radiation Damage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location
Jyvaskyla
ISSN
0379-6566
Print_ISBN
978-1-4577-0481-9
Type
conf
DOI
10.1109/RADECS.2008.5782740
Filename
5782740
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