DocumentCode :
3366133
Title :
Smart behavioral netlist simulation for SEU protection verification
Author :
Schulz, Simon ; Beltrame, Giovanni ; Merodio-Codinachs, David
Author_Institution :
ESTEC, Eur. Space Agency, Noordwijk, Netherlands
fYear :
2008
fDate :
10-12 Sept. 2008
Firstpage :
406
Lastpage :
411
Abstract :
This paper presents a novel approach to verify the correct implementation of Triple Modular Redundancy (TMR) for the memory elements of a given netlist using formal analysis. The purpose is detecting any issues that might incur during the use of automatic tools for TMR insertion, optimization, place and route, etc. Our analysis does not require a testbench and can perform full, exhaustive coverage within less than an hour even for large designs. This is achieved by applying a divide et impera approach, splitting the circuit into smaller submodules without loss of generality, instead of applying formal verification to the whole netlist at once. The methodology has been applied to a production netlist of the LEON2-FT processor that reported errors during radiation testing, successfully showing its TMR implementation issues.
Keywords :
circuit optimisation; circuit simulation; electronic engineering computing; formal verification; logic design; logic testing; radiation effects; LEON2-FT processor; SEU protection verification; TMR implementation issue; TMR insertion; automatic tools; formal analysis; memory elements; optimization; production netlist; radiation testing; reported errors; smart behavioral netlist simulation; submodules; triple modular redundancy; Algorithm design and analysis; Analytical models; Circuit faults; Logic gates; Runtime; Testing; Tunneling magnetoresistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location :
Jyvaskyla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0481-9
Type :
conf
DOI :
10.1109/RADECS.2008.5782753
Filename :
5782753
Link To Document :
بازگشت