DocumentCode :
3366182
Title :
Non-destructive examination of impulse generator pulses
Author :
Vasquez, J.A. ; Zirnheld, J. ; Burke, K. ; Foley, V. ; Sarjeant, W.J.
Author_Institution :
High Power Electron. Inst., State Univ. of New York, Buffalo, NY, USA
Volume :
2
fYear :
1997
fDate :
June 29 1997-July 2 1997
Firstpage :
1513
Abstract :
To produce a single-shot impulse waveform with a peak voltage of 600 kV, having 15 kJ of energy, a Marx Bank was used which had six 100 kV, 0.5 /spl mu/F capacitors arranged in six stages, charged in parallel and discharged in series. The overall performance and reliability of this Marx Bank was improved by inserting new high power, noninductive resistors in the discharge circuit to dissipate excess energy resulting from switch misfires and load faults. Among the specific technical design issues addressed is the development of a new nondestructive examination technique (NDET) for different modes of Marx Bank operation, which determines if output load faults or switch misfires will be safely tolerated by the resistors used in the charge/discharge circuits. Initial results, including computer simulations and laboratory measurements, using a new fault protecting, energy-absorbing resistor placed in series with the Marx output load are presented. Also, circuit design recommendations for further reduction in fault energies dissipated in the tail resistors of a misfired stage are discussed. As well as the elimination of current ringing from the fault-protecting resistor under fault conditions is described.
Keywords :
nondestructive testing; power capacitors; power supplies to apparatus; pulse generators; pulsed power technology; 0.5 muF; 100 kV; 15 kJ; 600 kV; Marx generator; computer simulations; design recommendations; fault energy dissipation; impulse generator pulses; laboratory measurements; nondestructive examination technique; noninductive resistors; output load faults; performance; power capacitor bank; pulsed power supplies; reliability; switch misfires; technical design; Capacitors; Circuit faults; Computer simulation; Energy measurement; Laboratories; Pulse generation; Resistors; Switches; Switching circuits; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 1997. Digest of Technical Papers. 1997 11th IEEE International
Conference_Location :
Baltimore, MA, USA
Print_ISBN :
0-7803-4213-5
Type :
conf
DOI :
10.1109/PPC.1997.674618
Filename :
674618
Link To Document :
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