DocumentCode :
3366318
Title :
Microstructure and electrical properties of (1−x)Bi0.5(Na0.80K0.20)0.5TiO3-xLiNbO3 lead-free piezoelectric ceramics
Author :
Wannasut, Pimpilai ; Watcharapasorn, Anucha ; Jaita, Pharatree ; Jiansirisomboon, Sukanda
Author_Institution :
Phys. & Mater. Sci., Chiang Mai Univ., Chiang Mai, Thailand
fYear :
2015
fDate :
24-27 May 2015
Firstpage :
167
Lastpage :
170
Abstract :
Lead-free piezoelectric ceramics with the formula of (1-x)Bi0.5(Na0.80K0.20)0.5TiO3-xLiNbO3 or (1-x)BNKT-xLN system, when x = 0, 0.01, 0.02, 0.03, 0.04, 0.05 and 0.06 mol fraction, were fabricated by a conventional mixed oxide method and sintered at the temperature of 1100°C for 2 h. All ceramics were focused in terms of phase, microstructure, dielectric, ferroelectric and piezoelectric properties. All samples have the density ranging of 5.50 - 5.66 g/cm3. X-ray diffraction pattern exhibited a single perovskite structure without any secondary phases. Scanning electron micrographs indicated a cubic-like grain shape occurred for all compositions with average grain size of 1.11 - 1.09 μm. The addition of LN also improved dielectric properties of BNKT ceramic. The maximum dielectric constant measured at room temperature was 1830 for BNKT-0.03LN sample.
Keywords :
X-ray diffraction; bismuth compounds; density; grain size; lithium compounds; permittivity; piezoceramics; potassium compounds; scanning electron microscopy; sintering; sodium compounds; Bi0.5(Na0.80K0.20)0.5TiO3-LiNbO3; X-ray diffraction pattern; conventional mixed oxide method; cubic like grain shape; density; dielectric constant; grain size; lead free piezoelectric ceramics; microstructure; perovskite structure; scanning electron micrographs; sintering; temperature 1100 degC; time 2 h; Ceramics; Dielectrics; Grain size; Lead; Microstructure; Temperature; Temperature measurement; Electrical properties; Lead-free piezoelectric ceramics; Microstructure; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectric, International Symposium on Integrated Functionalities and Piezoelectric Force Microscopy Workshop (ISAF/ISIF/PFM), 2015 Joint IEEE International Symposium on the
Conference_Location :
Singapore
Type :
conf
DOI :
10.1109/ISAF.2015.7172696
Filename :
7172696
Link To Document :
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