Title :
Research on high precision profile control technique of silicon steel for UCM tandem cold rolling mill
Author :
Sun, Wen-quan ; Yang, Quan ; Shao, Jian ; He, An-rui ; Li, Ming-xi
Author_Institution :
Nat. Eng. Res. Center for Adv. Rolling Technol., Univ. of Sci. & Technol. Beijing, Beijing, China
Abstract :
UCM cold rolling mill has strong ability of crown and flatness control, but it seriously lacks the edge drop control ability. In this paper, an explicit dynamic finite element method is adopted to build a combinatorial simulation model for roll stacks and strip, based on the 4-stand PL-TCM cold rolling mill of Masteel. Then the method of optimizing the intermediate roll shift position is proposed to reduce transverse thickness deviation along the strip width of silicon strip. In addition, U-EDC work roll contour which was independently designed was introduced. The result of the new strip shape control technology´s application shows that average edge drop of silicon steel strips is less than 5μm, and the proportion of the transverse thickness deviation along the strip width direction less than 10μm reaches 98.7%. Those new technology accomplish high precision profile control in 6-high mill which has no work roll shifting.
Keywords :
cold rolling; design engineering; finite element analysis; precision engineering; rolling mills; silicon; steel; 4-stand PL-TCM cold rolling mill; Masteel; U-EDC; UCM tandem cold rolling mill; combinatorial simulation; crown control; dynamic finite element method; edge drop control; flatness control; high precision profile control; intermediate roll shift position; roll contour; roll stacks; roll strip; silicon steel strips; strip shape control; Finite element methods; Helium; Iron; Milling machines; Optimization methods; Shape control; Silicon; Steel; Strips; Sun; U-EDC edge drop control work roll; UCM tandem cold rolling mill; high precision profile control; silicon steel;
Conference_Titel :
Mechanic Automation and Control Engineering (MACE), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-7737-1
DOI :
10.1109/MACE.2010.5536623