Title :
Atomic force microscopy on cells adhering to a substrate: a tool for cellular engineering
Author :
Grattarola, Massimo ; Ricci, Davide ; Tedesco, Mariateresa
Author_Institution :
Dept. of Biophys. & Electron. Eng., Genoa Univ., Italy
fDate :
31 Oct-3 Nov 1996
Abstract :
Atomic Force Microscopy (AFM) is utilized to characterize flat biological samples, such as neuron growth cones and living confluent 3T6 cells. Images based on mechanical contrast are obtained and related morphological details, mostly regarding the cell cytoskeleton, are analyzed. Moreover, numerical estimates of the local mechanical properties of the living cells are given, by extensive use of the “force-versus-distance” operation mode. On the basis of the results obtained, the potentialities of SFM as an optimal new technique available for probing cellular engineering issues, such as biocompatibility and cellular biomechanics are shortly considered
Keywords :
adhesion; atomic force microscopy; biological techniques; biomechanics; cellular biophysics; biocompatibility; cell cytoskeleton; cells adhering to substrate; cellular biomechanics; cellular engineering tool; flat biological samples; force-versus-distance operation mode; living confluent 3T6 cells; mechanical contrast; morphological details; neuron growth cones; Atomic force microscopy; Biomechanics; Biomedical optical imaging; Cells (biology); Electron microscopy; Embryo; Glass; Mechanical factors; Optical microscopy; Springs;
Conference_Titel :
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location :
Amsterdam
Print_ISBN :
0-7803-3811-1
DOI :
10.1109/IEMBS.1996.646427
